We report the structural characterization by XAFS spectroscopy at the Cu K-edge of three different CuHCF-based electrodes deposited on ITO (indium tin oxide) substrate. The electrochemical characterization confirms the occurrence of typical CuHCF films on the ITO surface. The EXAFS analysis evidences the strong multiple scattering effects in these compounds which makes the EXAFS probe effective for distances up to 5 Å from the photo-absorber. The presence of Cu-N-C-Fe linear chains with a high multiplicity has allowed us to determine accurately the local environment of Cu which also includes the Fe atom. The XAFS characterization of the Cu2+-loaded CuHCF shows the best agreement with the structural model for copper hexacyanoferrate, which also features [Fe(CN)6]3- ion vacancies.

Structural study of the Cu2+-loaded copper hexacyanoferrate electrode deposited on indium tin oxide substrate

Giorgetti M.;Minicucci M.
2013-01-01

Abstract

We report the structural characterization by XAFS spectroscopy at the Cu K-edge of three different CuHCF-based electrodes deposited on ITO (indium tin oxide) substrate. The electrochemical characterization confirms the occurrence of typical CuHCF films on the ITO surface. The EXAFS analysis evidences the strong multiple scattering effects in these compounds which makes the EXAFS probe effective for distances up to 5 Å from the photo-absorber. The presence of Cu-N-C-Fe linear chains with a high multiplicity has allowed us to determine accurately the local environment of Cu which also includes the Fe atom. The XAFS characterization of the Cu2+-loaded CuHCF shows the best agreement with the structural model for copper hexacyanoferrate, which also features [Fe(CN)6]3- ion vacancies.
2013
262
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11581/445775
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 4
  • ???jsp.display-item.citation.isi??? 4
social impact