A model-based on Josephson junctions array and Coulomb blockage-is presented that is capable to explain reentrant resistive peaks in diamondlike carbon-silicon films containing tungsten. Such systems show a main transition together with one or two reentrant or quasireentrant ones: computer simulations for one reentrant resistive peak have been performed that confirm with clear evidence the experimental data.

Reentrant superconductivity mechanisms in amorphous carbon-silicon films containing tungsten

MANCINI, Giorgio;STIZZA, Sergio
2000-01-01

Abstract

A model-based on Josephson junctions array and Coulomb blockage-is presented that is capable to explain reentrant resistive peaks in diamondlike carbon-silicon films containing tungsten. Such systems show a main transition together with one or two reentrant or quasireentrant ones: computer simulations for one reentrant resistive peak have been performed that confirm with clear evidence the experimental data.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11581/242849
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