We calculate self-consistently the dependence of electron-electron correlations on electron-defect scattering processes in quantum wires with only the lowest subband occupied. We use the Singwi-Tosi-Land-Sjo¨lander approach to calculate the many-body electron-electron correlations. The effect of electron scattering from randomly distributed Coulombic impurities and off surface roughness of the wire is treated using selfconsistent current-relaxation theory. Electron correlations can become very strong even at relatively high electron densities if the wire diameter is made sufficiently small. For a fixed disorder level the electron-defect scattering rate increases with increasing electron correlations. The plasmon dispersion depends on electron correlations and on the level of disorder. Electron-electron correlations transfer spectral weight at finite wave number from the plasmon to the single-particle excitations.

Electron correlations in thin disordered quantum wires

NEILSON, DAVID
1997-01-01

Abstract

We calculate self-consistently the dependence of electron-electron correlations on electron-defect scattering processes in quantum wires with only the lowest subband occupied. We use the Singwi-Tosi-Land-Sjo¨lander approach to calculate the many-body electron-electron correlations. The effect of electron scattering from randomly distributed Coulombic impurities and off surface roughness of the wire is treated using selfconsistent current-relaxation theory. Electron correlations can become very strong even at relatively high electron densities if the wire diameter is made sufficiently small. For a fixed disorder level the electron-defect scattering rate increases with increasing electron correlations. The plasmon dispersion depends on electron correlations and on the level of disorder. Electron-electron correlations transfer spectral weight at finite wave number from the plasmon to the single-particle excitations.
1997
262
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11581/242844
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact