The authors present several illustrative multiple-trapping current-time characteristics in thin dielectric layers with enhanced trap concentration in the near-contact regions. Such a spatial trap distribution, for different energy trap distributions, leads to a variety of different non-typical shapes of the characteristics. The results have been obtained with the aid of a Monte Carlo simulation for conditions corresponding to the typical time-of-flight method.
Multiple -Trapping Transient Currents in Thin Dielectric Layers with Enhanced Trap Density in the Near-Contact Regions
FELIZIANI, Sandro;MANCINI, Giorgio
1990-01-01
Abstract
The authors present several illustrative multiple-trapping current-time characteristics in thin dielectric layers with enhanced trap concentration in the near-contact regions. Such a spatial trap distribution, for different energy trap distributions, leads to a variety of different non-typical shapes of the characteristics. The results have been obtained with the aid of a Monte Carlo simulation for conditions corresponding to the typical time-of-flight method.File in questo prodotto:
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