Multiple -Trapping Transient Currents in Thin Dielectric Layers with Enhanced Trap Density in the Near-Contact Regions

The authors present several illustrative multiple-trapping current-time characteristics in thin dielectric layers with enhanced trap concentration in the near-contact regions. Such a spatial trap distribution, for different energy trap distributions, leads to a variety of different non-typical shapes of the characteristics. The results have been obtained with the aid of a Monte Carlo simulation for conditions corresponding to the typical time-of-flight method.