The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 - 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.
Novel XAFS capabilities at ELETTRA synchrotron light source
DI CICCO, Andrea;MINICUCCI, Marco;
2009-01-01
Abstract
The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 - 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
