X-ray diffraction, transmission electron microscopy, extended x-ray absorption fine structure spectroscopy, and x-ray photoemission spectroscopy have been used to study the structural properties of MnxGe1-x ion implanted alloys (x similar or equal to 0.04) at 240 and 270 degrees C substrate temperatures. Between 40% and 50% of the Mn atoms are found to occupy substitutional sites. No interstitial Mn atoms are found. The Mn-Ge coordination distance is 2.50(2) angstrom. Moreover, in the subsurface implanted layer [up to 32(2) nm depth] all the Mn atoms are effectively diluted in the Ge matrix, reaching a peak doping concentration of 7 +/- 1%. (c) 2006 American Institute of Physics.

Direct structural evidences of Mn dilution in Ge

GUNNELLA, Roberto;DI CICCO, Andrea;
2006

Abstract

X-ray diffraction, transmission electron microscopy, extended x-ray absorption fine structure spectroscopy, and x-ray photoemission spectroscopy have been used to study the structural properties of MnxGe1-x ion implanted alloys (x similar or equal to 0.04) at 240 and 270 degrees C substrate temperatures. Between 40% and 50% of the Mn atoms are found to occupy substitutional sites. No interstitial Mn atoms are found. The Mn-Ge coordination distance is 2.50(2) angstrom. Moreover, in the subsurface implanted layer [up to 32(2) nm depth] all the Mn atoms are effectively diluted in the Ge matrix, reaching a peak doping concentration of 7 +/- 1%. (c) 2006 American Institute of Physics.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11581/237429
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 42
  • ???jsp.display-item.citation.isi??? 43
social impact