Magnetic force microscopy has been used to study MnxGe1x=Geð1 0 0Þ films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x 1⁄4 0:027 and 0.044. No clearcut magnetic effect has been observed for x 1⁄4 0:053: Scanning tunneling microscopy has been used to investigate their morphology.

Magnetic properties of thin MnGe films investigated by magnetic force microscopy

PINTO, Nicola;GUNNELLA, Roberto;MURRI, Roberto Vittorio;
2004

Abstract

Magnetic force microscopy has been used to study MnxGe1x=Geð1 0 0Þ films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x 1⁄4 0:027 and 0.044. No clearcut magnetic effect has been observed for x 1⁄4 0:053: Scanning tunneling microscopy has been used to investigate their morphology.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11581/203159
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