Magnetic force microscopy has been used to study MnxGe1x=Geð1 0 0Þ films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x 1⁄4 0:027 and 0.044. No clearcut magnetic effect has been observed for x 1⁄4 0:053: Scanning tunneling microscopy has been used to investigate their morphology.
Magnetic properties of thin MnGe films investigated by magnetic force microscopy
PINTO, Nicola;GUNNELLA, Roberto;MURRI, Roberto Vittorio;
2004-01-01
Abstract
Magnetic force microscopy has been used to study MnxGe1x=Geð1 0 0Þ films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x 1⁄4 0:027 and 0.044. No clearcut magnetic effect has been observed for x 1⁄4 0:053: Scanning tunneling microscopy has been used to investigate their morphology.File in questo prodotto:
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