Methods and Instruments | Transmission Electron Microscopy

Transmission Electron Microscope (TEM) and related techniques, such as High-Resolution Transmission Electron Microscopy (HRTEM), Scanning Transmission Electron Microscopy (STEM), principles and applications in the field of electrochemical power sources are briefly described. Instrumentation and operation are introduced together with the basis of electron scattering phenomena that generate contrast both in the real (imaging mode) and reciprocal space (diffraction mode). Applications of TEM to the study of materials in electrochemical devices are discussed demonstrating the capability of this technique in the characterization of electrochemically active materials down to the atomic scale, also by the mean of innovative methods such as operando- and cryo-STEM.