Piezoelectric drivers are widely used in nanoscale image acquisition systems. A source of performance degradation of these drivers is hysteresis, which introduces low rate noise and causes a slow continuous drift, decreasing the quality of scanned images. In this paper a sliding mode control policy, based on an estimator of the perturbation due to hysteresis, is applied to the control of a piezostage in a three dimensional images acquisition system, in order to improve control performances and final scanning results. The presented solution has been experimentally tested and compared with the Proportional-Integrative-Derivative (PID) controllers provided with the piezoelectric acquisition system, showing a noticeable improvement both in the piezostage behavior and in the images quality. © 2016 IEEE.

Robust control of piezostage for nanoscale three-dimensional images acquisition

CORRADINI, Maria Letizia;
2016-01-01

Abstract

Piezoelectric drivers are widely used in nanoscale image acquisition systems. A source of performance degradation of these drivers is hysteresis, which introduces low rate noise and causes a slow continuous drift, decreasing the quality of scanned images. In this paper a sliding mode control policy, based on an estimator of the perturbation due to hysteresis, is applied to the control of a piezostage in a three dimensional images acquisition system, in order to improve control performances and final scanning results. The presented solution has been experimentally tested and compared with the Proportional-Integrative-Derivative (PID) controllers provided with the piezoelectric acquisition system, showing a noticeable improvement both in the piezostage behavior and in the images quality. © 2016 IEEE.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11581/395327
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 3
social impact