RAUF, MUHAMMAD
RAUF, MUHAMMAD
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Surface potential dependence of the topological insulator Bi2Se3 studied by scanning photoemission and Kelvin probe microscopy
2024-01-01 Azizinia, M.; Salvato, M.; Castrucci, P.; Amati, M.; Gregoratti, L.; Parmar, R.; Rauf, M.; Gunnella, R.
Thickness dependent oxidation in CrCl 3 : a scanning X-ray photoemission and Kelvin probe microscopies study
2025-01-01 Kazim, Shafaq; Parmar, Rahul; Azizinia, Maryam; Amati, Matteo; Rauf, Muhammad; Di Cicco, Andrea; Rezvani, Seyed Javid; Mastrippolito, Dario; Ottaviano, Luca; Klimczuk, Tomasz; Gregoratti, Luca; Gunnella, Roberto
| Titolo | Data di pubblicazione | Autore(i) | Tipo | File |
|---|---|---|---|---|
| Surface potential dependence of the topological insulator Bi2Se3 studied by scanning photoemission and Kelvin probe microscopy | 1-gen-2024 | Azizinia, M.; Salvato, M.; Castrucci, P.; Amati, M.; Gregoratti, L.; Parmar, R.; Rauf, M.; Gunnella, R. | Articolo | |
| Thickness dependent oxidation in CrCl 3 : a scanning X-ray photoemission and Kelvin probe microscopies study | 1-gen-2025 | Kazim, Shafaq; Parmar, Rahul; Azizinia, Maryam; Amati, Matteo; Rauf, Muhammad; Di Cicco, Andrea; Rezvani, Seyed Javid; Mastrippolito, Dario; Ottaviano, Luca; Klimczuk, Tomasz; Gregoratti, Luca; Gunnella, Roberto | Articolo |