Sfoglia per Autore
APPLICATION OF A COMPLEX POTENTIAL TO THE INTERPRETATION OF XANES SPECTRA - THE CASE OF NA K-EDGE IN NACL
1990-01-01 Gunnella, Roberto
CHEMICAL-SHIFT LOW-ENERGY PHOTOELECTRON DIFFRACTION - A DETERMINATION OF THE INP(110) CLEAN SURFACE STRUCTURAL RELAXATION
1993-01-01 S., Gota; Gunnella, Roberto
ANGULAR-DEPENDENCE OF THE EXFAS (EXTENDED FINE AUGER STRUCTURE) IN MGO(100) SURFACES - SHORT-RANGE ORDER VERSUS DIFFRACTION EFFECTS
1994-01-01 I., Davoli; R., Bernardini; C., Battistoni; P., Castrucci; Gunnella, Roberto; M., Decrescenzi
Structural surface investigation with low energy backscattered electrons
1995-01-01 M., Decrescenzi; Gunnella, Roberto; I., Davoli
Incident beam effects in AED (Auger electron diffraction): The case of Cu(001)
1995-01-01 I., Davoli; Gunnella, Roberto; P., Castrucci; R., Bernardini; M., Decrescenzi
Inelastic processes versus diffraction effects: Polar-angle energy-loss spectra of the graphite K edge
1995-01-01 Gunnella, Roberto; I., Davoli; R., Bernardini; M., Decrescenzi
AUGER-ELECTRON DIFFRACTION IN THE LOW KINETIC-ENERGY RANGE - THE SI(111)7X7 SURFACE RECONSTRUCTION AND GE/SI INTERFACE FORMATION
1995-01-01 M., Decrescenzi; Gunnella, Roberto; R., Bernardini; M., De Marco; I., Davoli
SURFACE CORE-LEVEL PHOTOELECTRON DIFFRACTION FROM SI DIMERS AT THE SI(001)-(2X1) SURFACE
1995-01-01 E. L., Bullobk; Gunnella, Roberto; L., Patthey; T., Abukawa; S., Kono; C. R., Natoli; L. S. O., Johansson
Extended fine-structure in secondary backscattered electrons
1996-01-01 M., De Crescenzi; S., Colonna; Gunnella, Roberto; M., Fanfoni
The As/Si(111) surface studied by angle scanned low energy photoelectron diffraction
1996-01-01 Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg; L. S. O., Johansson
Angle dependence of the spin-orbit branching ratio
1996-01-01 E. L., Bullock; Gunnella, Roberto; C. R., Natoli; H. W., Yeom; S., Kono; L., Patthey; R. I. G., Uhrberg; L. S. O., Johansson
Surface core-level shift photoelectron diffraction from As/Si(111)
1996-01-01 L. S. O., Johansson; Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg
X-ray photoelectron-diffraction study of intermixing and morphologyat the Ge/Si(001) and Ge/Sb/Si(001) interface.
1996-01-01 Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Davoli, I.; Sébilleau, D.; De Crescenzi, M.
XPD study of atomic intermixing at the Ge/Si(001) interface.
1996-01-01 Davoli, I.; Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Bernardini, R.; De Crescenzi, M.
Low Kinetic energy AED: a tool for the study of Geepitaxial layers grown on Sb-terminated Si(111) surface
1997-01-01 DE CRESCENZI, M.; Gunnella, Roberto
SiC formation by reaction of Si(100) with acetylene; electronic structure and growth mode
1997-01-01 DE CRESCENZI, M.; Gunnella, Roberto
Evidence for the suppression of incident beam effects in Auger electron diffraction
1998-01-01 DE CRESCENZI, M.; Gunnella, Roberto
Electronic and structural properties of the 6H-SiC(0001) surfaces
1998-01-01 Gunnella, Roberto; J. Y., Veuillen; A., Barthet; T., Tan
Surface-core-level-shift low-energy photoelectron diffraction: The 2x1-Si(001) surface
1998-01-01 Gunnella, Roberto; E. L., Bullock; L., Patthey; C., R> Natoli; T., Abukawa; S., Kono; L. S. O., Johansson
X-ray absorption spectroscopy study of atomic structure of epitaxial ErSi1.7(0001) on Si(111)
1998-01-01 Gunnella, Roberto; J. Y., Veuillen; T., Tan; A. M., Flank
Titolo | Data di pubblicazione | Autore(i) | Tipo | File |
---|---|---|---|---|
APPLICATION OF A COMPLEX POTENTIAL TO THE INTERPRETATION OF XANES SPECTRA - THE CASE OF NA K-EDGE IN NACL | 1-gen-1990 | Gunnella, Roberto | Articolo | |
CHEMICAL-SHIFT LOW-ENERGY PHOTOELECTRON DIFFRACTION - A DETERMINATION OF THE INP(110) CLEAN SURFACE STRUCTURAL RELAXATION | 1-gen-1993 | S., Gota; Gunnella, Roberto | Articolo | |
ANGULAR-DEPENDENCE OF THE EXFAS (EXTENDED FINE AUGER STRUCTURE) IN MGO(100) SURFACES - SHORT-RANGE ORDER VERSUS DIFFRACTION EFFECTS | 1-gen-1994 | I., Davoli; R., Bernardini; C., Battistoni; P., Castrucci; Gunnella, Roberto; M., Decrescenzi | Articolo | |
Structural surface investigation with low energy backscattered electrons | 1-gen-1995 | M., Decrescenzi; Gunnella, Roberto; I., Davoli | Articolo | |
Incident beam effects in AED (Auger electron diffraction): The case of Cu(001) | 1-gen-1995 | I., Davoli; Gunnella, Roberto; P., Castrucci; R., Bernardini; M., Decrescenzi | Articolo | |
Inelastic processes versus diffraction effects: Polar-angle energy-loss spectra of the graphite K edge | 1-gen-1995 | Gunnella, Roberto; I., Davoli; R., Bernardini; M., Decrescenzi | Articolo | |
AUGER-ELECTRON DIFFRACTION IN THE LOW KINETIC-ENERGY RANGE - THE SI(111)7X7 SURFACE RECONSTRUCTION AND GE/SI INTERFACE FORMATION | 1-gen-1995 | M., Decrescenzi; Gunnella, Roberto; R., Bernardini; M., De Marco; I., Davoli | Articolo | |
SURFACE CORE-LEVEL PHOTOELECTRON DIFFRACTION FROM SI DIMERS AT THE SI(001)-(2X1) SURFACE | 1-gen-1995 | E. L., Bullobk; Gunnella, Roberto; L., Patthey; T., Abukawa; S., Kono; C. R., Natoli; L. S. O., Johansson | Articolo | |
Extended fine-structure in secondary backscattered electrons | 1-gen-1996 | M., De Crescenzi; S., Colonna; Gunnella, Roberto; M., Fanfoni | Articolo | |
The As/Si(111) surface studied by angle scanned low energy photoelectron diffraction | 1-gen-1996 | Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg; L. S. O., Johansson | Articolo | |
Angle dependence of the spin-orbit branching ratio | 1-gen-1996 | E. L., Bullock; Gunnella, Roberto; C. R., Natoli; H. W., Yeom; S., Kono; L., Patthey; R. I. G., Uhrberg; L. S. O., Johansson | Articolo | |
Surface core-level shift photoelectron diffraction from As/Si(111) | 1-gen-1996 | L. S. O., Johansson; Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg | Articolo | |
X-ray photoelectron-diffraction study of intermixing and morphologyat the Ge/Si(001) and Ge/Sb/Si(001) interface. | 1-gen-1996 | Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Davoli, I.; Sébilleau, D.; De Crescenzi, M. | Articolo | |
XPD study of atomic intermixing at the Ge/Si(001) interface. | 1-gen-1996 | Davoli, I.; Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Bernardini, R.; De Crescenzi, M. | Articolo | |
Low Kinetic energy AED: a tool for the study of Geepitaxial layers grown on Sb-terminated Si(111) surface | 1-gen-1997 | DE CRESCENZI, M.; Gunnella, Roberto | Articolo | |
SiC formation by reaction of Si(100) with acetylene; electronic structure and growth mode | 1-gen-1997 | DE CRESCENZI, M.; Gunnella, Roberto | Articolo | |
Evidence for the suppression of incident beam effects in Auger electron diffraction | 1-gen-1998 | DE CRESCENZI, M.; Gunnella, Roberto | Articolo | |
Electronic and structural properties of the 6H-SiC(0001) surfaces | 1-gen-1998 | Gunnella, Roberto; J. Y., Veuillen; A., Barthet; T., Tan | Articolo | |
Surface-core-level-shift low-energy photoelectron diffraction: The 2x1-Si(001) surface | 1-gen-1998 | Gunnella, Roberto; E. L., Bullock; L., Patthey; C., R> Natoli; T., Abukawa; S., Kono; L. S. O., Johansson | Articolo | |
X-ray absorption spectroscopy study of atomic structure of epitaxial ErSi1.7(0001) on Si(111) | 1-gen-1998 | Gunnella, Roberto; J. Y., Veuillen; T., Tan; A. M., Flank | Articolo |
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