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Mostrati risultati da 1 a 20 di 168
Titolo Data di pubblicazione Autore(i) Tipo File
APPLICATION OF A COMPLEX POTENTIAL TO THE INTERPRETATION OF XANES SPECTRA - THE CASE OF NA K-EDGE IN NACL 1-gen-1990 Gunnella, Roberto Articolo
CHEMICAL-SHIFT LOW-ENERGY PHOTOELECTRON DIFFRACTION - A DETERMINATION OF THE INP(110) CLEAN SURFACE STRUCTURAL RELAXATION 1-gen-1993 S., Gota; Gunnella, Roberto Articolo
ANGULAR-DEPENDENCE OF THE EXFAS (EXTENDED FINE AUGER STRUCTURE) IN MGO(100) SURFACES - SHORT-RANGE ORDER VERSUS DIFFRACTION EFFECTS 1-gen-1994 I., Davoli; R., Bernardini; C., Battistoni; P., Castrucci; Gunnella, Roberto; M., Decrescenzi Articolo
Structural surface investigation with low energy backscattered electrons 1-gen-1995 M., Decrescenzi; Gunnella, Roberto; I., Davoli Articolo
Incident beam effects in AED (Auger electron diffraction): The case of Cu(001) 1-gen-1995 I., Davoli; Gunnella, Roberto; P., Castrucci; R., Bernardini; M., Decrescenzi Articolo
Inelastic processes versus diffraction effects: Polar-angle energy-loss spectra of the graphite K edge 1-gen-1995 Gunnella, Roberto; I., Davoli; R., Bernardini; M., Decrescenzi Articolo
AUGER-ELECTRON DIFFRACTION IN THE LOW KINETIC-ENERGY RANGE - THE SI(111)7X7 SURFACE RECONSTRUCTION AND GE/SI INTERFACE FORMATION 1-gen-1995 M., Decrescenzi; Gunnella, Roberto; R., Bernardini; M., De Marco; I., Davoli Articolo
SURFACE CORE-LEVEL PHOTOELECTRON DIFFRACTION FROM SI DIMERS AT THE SI(001)-(2X1) SURFACE 1-gen-1995 E. L., Bullobk; Gunnella, Roberto; L., Patthey; T., Abukawa; S., Kono; C. R., Natoli; L. S. O., Johansson Articolo
Extended fine-structure in secondary backscattered electrons 1-gen-1996 M., De Crescenzi; S., Colonna; Gunnella, Roberto; M., Fanfoni Articolo
The As/Si(111) surface studied by angle scanned low energy photoelectron diffraction 1-gen-1996 Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg; L. S. O., Johansson Articolo
Angle dependence of the spin-orbit branching ratio 1-gen-1996 E. L., Bullock; Gunnella, Roberto; C. R., Natoli; H. W., Yeom; S., Kono; L., Patthey; R. I. G., Uhrberg; L. S. O., Johansson Articolo
Surface core-level shift photoelectron diffraction from As/Si(111) 1-gen-1996 L. S. O., Johansson; Gunnella, Roberto; E. L., Bullock; C. R., Natoli; R. I. G., Uhrberg Articolo
X-ray photoelectron-diffraction study of intermixing and morphologyat the Ge/Si(001)… and Ge/Sb/Si(001)… interface. 1-gen-1996 Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Davoli, I.; Sébilleau, D.; De Crescenzi, M. Articolo
XPD study of atomic intermixing at the Ge/Si(001) interface. 1-gen-1996 Davoli, I.; Gunnella, Roberto; Castrucci, P.; Pinto, Nicola; Bernardini, R.; De Crescenzi, M. Articolo
Low Kinetic energy AED: a tool for the study of Geepitaxial layers grown on Sb-terminated Si(111) surface 1-gen-1997 DE CRESCENZI, M.; Gunnella, Roberto Articolo
SiC formation by reaction of Si(100) with acetylene; electronic structure and growth mode 1-gen-1997 DE CRESCENZI, M.; Gunnella, Roberto Articolo
Evidence for the suppression of incident beam effects in Auger electron diffraction 1-gen-1998 DE CRESCENZI, M.; Gunnella, Roberto Articolo
Electronic and structural properties of the 6H-SiC(0001) surfaces 1-gen-1998 Gunnella, Roberto; J. Y., Veuillen; A., Barthet; T., Tan Articolo
Surface-core-level-shift low-energy photoelectron diffraction: The 2x1-Si(001) surface 1-gen-1998 Gunnella, Roberto; E. L., Bullock; L., Patthey; C., R> Natoli; T., Abukawa; S., Kono; L. S. O., Johansson Articolo
X-ray absorption spectroscopy study of atomic structure of epitaxial ErSi1.7(0001) on Si(111) 1-gen-1998 Gunnella, Roberto; J. Y., Veuillen; T., Tan; A. M., Flank Articolo
Mostrati risultati da 1 a 20 di 168
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